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您现在的位置:首页 > 产品中心 > PID产品 > 便携式现场PID测试仪 > PID Check便携式现场PID测试仪

便携式现场PID测试仪

  • 更新时间:  2024-03-04
  • 产品型号:  PID Check
  • 简单描述
  • 便携式现场PID测试仪(电位诱发衰减)测试仪,适用于不同类型和尺寸的晶体硅组件,无需拆装,测试时间在8小时之内(测量时间将少于8小时)。PIDcheck是与德国Fraunhofer CSP Halle合作开发的。
详细介绍

便携式现场PID测试仪的好处和特点


安装后或采购光伏电站前的质量检查

PIDcheck是能够发现已安装的光伏组件是否对PID敏感的工具。


功率和产量预测

如果PID已经发生,只有PIDcheck的测量结果可以提供未来产量的预测。


评估针对PID的对策

PIDcheck设备能够模拟恢复设备(偏移箱、浮动控制器)的应用,因此有助于在其安装前评估恢复效果。

用于现场PID恢复的可逆高压极性

便携式现场PID测试仪可测量的参数


分流电阻、功率损耗、电导率、泄漏电流、湿度和温度

易于使用的便携式设备

欲了解更多信息,请访问www.pidcon。。com





●   原型:24个电池,在高压下正向暗I-V曲线的测量

●   新功能:高压可双向施加应力和恢复 在活动模块中成功演示

●   Fraunhofer CSP 于2015年*提交认证

●   2018年上市

●   用户:评估员、操作员、服务专家、安装人员、模块制作人






* Patent pending „Verfahren und Anordnung zur Prüfung eines Solarmoduls auf Anfälligkeit für Potentialinduzierte Degradation", DE 10 2015 213 047 A1


参考文献: cells  (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced  degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163

(2)V. Naumann, K. Ilse, M. Pander, J. Tröndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic

modules, AIP Conference Proceedings 2147, 090005 (2019).

(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects  at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).

(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Großer, S. Richter, A. Hähnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under  Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. Pöblau, S. Großer, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible  PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential  Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.

. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Großer, S. Richter, A. Hähnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under  Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. Pöblau, S. Großer, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible  PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential  Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.




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